7/30/2023 0 Comments Transformice map icons![]() The OmniScan X3 flaw detector makes analysis and reporting faster, both onboard the instrument and on a PC. Additional features that enable outstanding images include a 16-bit A-scan, interpolation and smoothing and a vivid 10.6-inch WXGA display that provides clarity and visibility in any light. With the total focusing method, users can produce geometrically correct images to confirm the characterization of flaws identified through conventional phased array techniques and obtain better images throughout the volume of a part. Creating a setup is also faster with improved calibration tools and support for simultaneous probe and beam set configuration, onboard dual linear, matrix and dual matrix array creation and automatic wedge verification.Ĭertified IP65 dust proof and water resistant, the instrument has the reliability and ease of use that OmniScan flaw detectors are known for combined with high-quality images that help make interpreting flaws more obvious. The entire scan plan, including the TFM zone, can be created in one simple workflow. ![]() ![]() The comprehensive onboard scan plan tool enables users to visualize the inspection, helping reduce the risk of errors. Wireless connectivity to the Olympus Scientific Cloud (OSC) makes it simple to keep the instrument’s software up to date.Simplified user interface with onboard scan plan.Up to 1,024 × 1,024-pixel TFM reconstruction and four simultaneous, live TFM propagation modes.Acoustic influence map (AIM) simulator for TFM mode.Improved phased array imaging, including an innovative live TFM envelope feature.TFM/FMC with 64-element aperture support.The OmniScan X3 flaw detector combines the essential tools needed for PAUT inspections, such as TOFD, two UT channels, eight groups and 16:64PR, 16:128PR and 32:128PR configurations*, with powerful innovations, including:
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